Electron Beam and Optical Depth Profiling of Quasibulk GaN

نویسندگان

  • L. Chernyak
  • A. Osinsky
  • G. Nootz
  • A. Schulte
  • J. Jasinski
  • Richard J. Molnar
چکیده

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Numerical Modeling of Electronic and Electrical Characteristics of 0.3 0.7 Al Ga N / GaN Multiple Quantum Well Solar Cells

The present study was conducted to investigate current density of0.3 0.7 Al Ga N/ GaN multiple quantum well solar cell (MQWSC) under hydrostaticpressure. The effects of hydrostatic pressure were taken into account to measureparameters of 0.3 0.7 Al Ga N/ GaN MQWSC, such as interband transition energy, electronholewave functions, absorption coefficient, and dielectric con...

متن کامل

وابستگی انرژی گذارهای اپتیکی در نانوساختارهای چاههای کوانتومی GaN/AlGaN به پهنای سد و چاه کوانتومی

Internal polarizations field which take place in quantum structures of group-III nitrides have an important consequence on their optical properties. Optical properties of wurtzite AlGaN/GaN quantum well (QW) structures grown by MBE and MOCVD on c-plane sapphire substrates have been investigated by means of photoluminescence (PL) and time resolved photoluminescence (TRPL) at low-temperature. PL ...

متن کامل

Low energy electron beam induced damage on InGaN/GaN quantum well structure

In this paper, low energy electron beam (5–20 keV, 0–500 lAs/cm) induced damage on a GaN/ InGaN/GaN near-surface quantum well structure is studied. Exposure to low energy electron beam is shown to significantly reduce the optical quality of the structure. It is also observed that reducing the electron beam energy causes larger PL intensity reduction. This can be explained by considering the bea...

متن کامل

Evaluation of Nitrogen Diffusion in Plasma Nitrided Iron by Various

   Diffusion of nitrogen in plasma nitrided iron and structural evolution during the nitriding process were evaluated by several characterization techniques including optical microscopy (OM), microhardness depth profiling (HDP), scanning electron microscopy (SEM), x-ray diffraction (XRD), glow discharge optical emission spectroscopy (GDOES), and secondary ion mass spectroscopy (SIMS). Plasma ni...

متن کامل

Band-Gap Tuning Of Electron Beam Evaporated Cds Thin Films

The effect of evaporation rate on structural, morphological and optical properties of electron beam evaporated CdS thin films have been investigated. CdS thin film deposited by electron beam evaporation method in 12nm/min and 60nm/min evaporation rates on glass substrates. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and Atomic Force Microscopy were used to character...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2015